Application: Line Width Calibration Equipment: CD-AFM and CD-SEM Features: Amorphous Silicon Isolated Line Traceability: SI units through NIST Product Range: 70 nm to 110 nm Wafer Diameter 200 mm 300 mm Layout X XY X XY Line Width (nm) 70 NCD8-70X NCD8-70XY NCD12-70X NCD12-70XY 110 NCD8-110X NCD8-110XY NCD12-110X NCD12-110XY